Table 5. Electrical Characteristics (T A = 25 ° C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Stage 1 — Off Characteristics (1)
Zero Gate Voltage Drain Leakage Current
(V DS = 65 Vdc, V GS = 0 Vdc)
Zero Gate Voltage Drain Leakage Current
(V DS = 28 Vdc, V GS = 0 Vdc)
Gate--Source Leakage Current
(V GS = 1.5 Vdc, V DS = 0 Vdc)
I DSS
I DSS
I GSS
10
1
1
μ Adc
μ Adc
μ Adc
Stage 1 — On Characteristics (1)
Gate Threshold Voltage
(V DS = 10 Vdc, I D = 28 μ Adc)
Gate Quiescent Voltage
(V DS = 28 Vdc, I DQ1A = 70 mA, I DQ1B = 160 mA)
V GS(th)
V GS(Q)
1.2
2.0
2.9
2.7
Vdc
Vdc
Fixture Gate Quiescent Voltage
(V DD = 28 Vdc, Measured in Functional Test)
I DQ1A = 70 mA
I DQ1B = 160 mA
V GG(Q)
4.0
7.1
5.0
8.1
6.0
9.1
Vdc
Stage 2 — Off Characteristics (1)
Zero Gate Voltage Drain Leakage Current
(V DS = 65 Vdc, V GS = 0 Vdc)
Zero Gate Voltage Drain Leakage Current
(V DS = 28 Vdc, V GS = 0 Vdc)
Gate--Source Leakage Current
(V GS = 1.5 Vdc, V DS = 0 Vdc)
I DSS
I DSS
I GSS
10
1
1
μ Adc
μ Adc
μ Adc
Stage 2 — On Characteristics (1)
Gate Threshold Voltage
(V DS = 10 Vdc, I D = 185 μ Adc)
Gate Quiescent Voltage
(V DS = 28 Vdc, I DQ2B = 500 mA)
Fixture Gate Quiescent Voltage
(V DD = 28 Vdc, I DQ2B = 500 mA, Measured in Functional Test)
Drain--Source On--Voltage
(V GS = 10 Vdc, I D = 1.8 Adc)
V GS(th)
V GS(Q)
V GG(Q)
V DS(on)
1.2
5.3
2.0
2.6
6.3
0.35
2.7
7.3
Vdc
Vdc
Vdc
Vdc
Functional Tests (2,3,4) (In Freescale Test Fixture, 50 ohm system) V DD = 28 Vdc, I DQ1A = 70 mA, I DQ1B = 160 mA, I DQ2B = 500 mA, V GS2A =
1.7 Vdc, P out = 30 W Avg., f = 1880 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability
on CCDF.
Power Gain
Power Added Efficiency
Output Peak--to--Average Ratio @ 0.01% Probability on CCDF
G ps
PAE
PAR
24.0
33.0
6.0
25.8
35.3
6.7
28.0
dB
%
dB
1.
2.
3.
4.
Each side of device measured separately.
Part internally matched both on input and output.
Measurement made with device in a Symmetrical Doherty configuration.
Measurement made with device in straight lead configuration before any lead forming operation is applied.
(continued)
MD7IC18120NR1 MD7IC18120GNR1
RF Device Data
Freescale Semiconductor
3
相关PDF资料
MDEV-315-HH-KF-MS KIT MASTER DEV MS KEYFOB 315MHZ
MDEV-418-HH-CP8-HS KIT DEV TX 418MHZ HS COMPACT
MDEV-418-HH-LR8-HS KIT DEV TX 418MHZ HS LONG-RANGE
MDEV-433-HH-CP8-MS KIT DEV TX 433MHZ MS SERIES
MDEV-433-HH-LR8-MS KIT DEV TX 433MHZ MS SER LONG-RG
MDEV-869-ES-USB KIT MASTER DEV 869MHZ ES USB
MDEV-900-HP3-PPS-RS232 KIT MASTER 900MHZ HP-3 SIP RS232
MDEV-900-HP3-SPS-USB KIT MASTER 900MHZ HP-3 USB SMD
相关代理商/技术参数
MD7IC2012GNR1 功能描述:射频MOSFET电源晶体管 HV7IC 2GHZ12W TO270WB14G RoHS:否 制造商:Freescale Semiconductor 配置:Single 晶体管极性: 频率:1800 MHz to 2000 MHz 增益:27 dB 输出功率:100 W 汲极/源极击穿电压: 漏极连续电流: 闸/源击穿电压: 最大工作温度: 封装 / 箱体:NI-780-4 封装:Tray
MD7IC2012NR1 功能描述:射频MOSFET电源晶体管 HV7IC 2GHZ 12W TO270WB14 RoHS:否 制造商:Freescale Semiconductor 配置:Single 晶体管极性: 频率:1800 MHz to 2000 MHz 增益:27 dB 输出功率:100 W 汲极/源极击穿电压: 漏极连续电流: 闸/源击穿电压: 最大工作温度: 封装 / 箱体:NI-780-4 封装:Tray
MD7IC2050GNR1 功能描述:功率放大器 HV7IC 2100MHZ TO270WB14G RoHS:否 制造商:TriQuint Semiconductor 封装 / 箱体: 工作电源电压:28 V 电源电流:2.5 A 工作温度范围: 封装:
MD7IC2050NBR1 功能描述:功率放大器 HV7IC 2100MHZ TO272WB14 RoHS:否 制造商:TriQuint Semiconductor 封装 / 箱体: 工作电源电压:28 V 电源电流:2.5 A 工作温度范围: 封装:
MD7IC2050NR1 功能描述:功率放大器 HV7IC 2100MHZ TO270WB14 RoHS:否 制造商:TriQuint Semiconductor 封装 / 箱体: 工作电源电压:28 V 电源电流:2.5 A 工作温度范围: 封装:
MD7IC2050NR1_10 制造商:FREESCALE 制造商全称:Freescale Semiconductor, Inc 功能描述:RF LDMOS Wideband Integrated Power Amplifiers
MD7IC21100GNR1 功能描述:射频放大器 HV7 2100MHZ TO270WB14G RoHS:否 制造商:Skyworks Solutions, Inc. 类型:Low Noise Amplifier 工作频率:2.3 GHz to 2.8 GHz P1dB:18.5 dBm 输出截获点:37.5 dBm 功率增益类型:32 dB 噪声系数:0.85 dB 工作电源电压:5 V 电源电流:125 mA 测试频率:2.6 GHz 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:QFN-16 封装:Reel
MD7IC21100N 制造商:Freescale Semiconductor 功能描述: